An automated approach to reducing test suites for testing retargeted C compilers for embedded systems.
Heung Seok ChaeGyun WooTae Yeon KimJung Ho BaeWon-Young KimPublished in: J. Syst. Softw. (2011)
Keyphrases
- embedded systems
- test suite
- test suite reduction
- test cases
- regression testing
- test case generation
- low cost
- software testing
- software systems
- hardware and software
- embedded software
- computing power
- code coverage
- testing process
- embedded devices
- resource limited
- number of test cases
- real time systems
- mutation testing
- hardware software
- consumer electronics
- hw sw
- test sequences
- set of test cases
- java programs
- data sets
- protocol stack
- test generation
- computer systems
- flash memory
- field programmable gate array
- massively parallel
- test data
- error rate
- database management systems
- training data
- database systems
- case study
- embedded real time systems
- real time