TEST SUITE REDUCTION
Experts
- Gregg Rothermel
- Tsong Yueh Chen
- Gordon Fraser
- Lionel C. Briand
- Jinfu Chen
- Rubing Huang
- Dave Towey
- Atif M. Memon
- Lu Zhang
- T. H. Tse
- Andrea Arcuri
- Bestoun S. Ahmed
- Baowen Xu
- Dan Hao
- Nina Yevtushenko
- Gregory M. Kapfhammer
- Zhenyu Chen
- Bo Jiang
- Hyunsook Do
- Franz Wotawa
- Renée C. Bryce
- W. K. Chan
- Arnaud Gotlieb
- Wasif Afzal
- Robert M. Hierons
- Mary Jean Harrold
- Phil McMinn
- Hadi Hemmati
- Sebastian G. Elbaum
- Yves Le Traon
- Man Fai Lau
- Zheng Li
- Lingming Zhang
- Dusica Marijan
- Wes Masri
- Ziyuan Wang
- Mark Harman
- Filippo Ricca
- Shin Yoo
Venues
- CoRR
- ICST
- ICST Workshops
- Inf. Softw. Technol.
- IEEE Trans. Software Eng.
- ICSE
- ISSTA
- J. Syst. Softw.
- Softw. Test. Verification Reliab.
- SEKE
- ASE
- ACM SIGSOFT Softw. Eng. Notes
- ISSRE
- QSIC
- ESEC/SIGSOFT FSE
- SSBSE
- ICSM
- Int. J. Softw. Eng. Knowl. Eng.
- SAC
- IEEE Access
- ICTSS
- COMPSAC
- ISSRE Workshops
- ACM Trans. Softw. Eng. Methodol.
- Softw. Qual. J.
- QRS
- 计算机科学
- CEC
- AST@ICSE
- QRS Companion
- SNPD
- Empir. Softw. Eng.
- APSEC
- SIGSOFT FSE
- AST
- COMPSAC (1)
- GECCO (Companion)
- J. Softw.
- FASE
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