TEST SUITE REDUCTION
Experts
- Tsong Yueh Chen
- Gregg Rothermel
- Gordon Fraser
- Lionel C. Briand
- Jinfu Chen
- Rubing Huang
- Dave Towey
- Atif M. Memon
- Lu Zhang
- Andrea Arcuri
- T. H. Tse
- Bestoun S. Ahmed
- Baowen Xu
- Dan Hao
- Nina Yevtushenko
- Hyunsook Do
- Bo Jiang
- Zhenyu Chen
- Franz Wotawa
- Gregory M. Kapfhammer
- Robert M. Hierons
- Yves Le Traon
- Mary Jean Harrold
- Arnaud Gotlieb
- W. K. Chan
- Phil McMinn
- Man Fai Lau
- Hadi Hemmati
- Renée C. Bryce
- Wasif Afzal
- Sebastian G. Elbaum
- Zheng Li
- Wes Masri
- Ziyuan Wang
- Mark Harman
- Lingming Zhang
- Dusica Marijan
- Filippo Ricca
- Nikolaus Hansen
Venues
- CoRR
- ICST
- ICST Workshops
- Inf. Softw. Technol.
- IEEE Trans. Software Eng.
- ISSTA
- ICSE
- J. Syst. Softw.
- SEKE
- Softw. Test. Verification Reliab.
- ASE
- ACM SIGSOFT Softw. Eng. Notes
- ISSRE
- SSBSE
- ESEC/SIGSOFT FSE
- QSIC
- ICSM
- Int. J. Softw. Eng. Knowl. Eng.
- COMPSAC
- ICTSS
- SAC
- IEEE Access
- ISSRE Workshops
- Softw. Qual. J.
- QRS
- ACM Trans. Softw. Eng. Methodol.
- CEC
- 计算机科学
- APSEC
- SNPD
- SIGSOFT FSE
- QRS Companion
- AST
- GECCO (Companion)
- COMPSAC (1)
- J. Softw.
- AST@ICSE
- FASE
- Empir. Softw. Eng.
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