Selection of potentially testable path delay faults for test generation.
Atsushi MurakamiSeiji KajiharaTsutomu SasaoIrith PomeranzSudhakar M. ReddyPublished in: ITC (2000)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- symbolic execution
- software testing
- static analysis
- design automation
- shortest path
- quality assurance
- fault diagnosis
- test data generation
- regression testing
- data sets
- fault detection
- high level
- test set
- path length
- database applications
- relational databases
- information technology
- case study
- computer vision
- machine learning
- code coverage
- neural network