LFSR-Based Test Generation for Path Delay Faults.
Irith PomeranzPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2019)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- symbolic execution
- software testing
- design automation
- static analysis
- quality assurance
- path length
- fault diagnosis
- test data generation
- test suite
- fault detection
- regression testing
- shortest path
- destination node
- database systems
- machine learning
- test set
- code coverage
- artificial intelligence
- image processing
- object oriented
- databases
- model based diagnosis