CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults.
Cecilia MetraMichele FavalliPiero OlivoBruno RiccòPublished in: ITC (1992)
Keyphrases
- high speed
- low power
- circuit design
- power dissipation
- fault diagnosis
- power consumption
- metal oxide semiconductor
- fault detection
- low cost
- fault model
- integrated circuit
- floating gate
- game playing
- cmos technology
- vlsi circuits
- test cases
- analog vlsi
- power supply
- built in self test
- root cause
- fault detection and diagnosis
- delay insensitive
- model based diagnosis
- expert systems
- rolling shutter
- multiple faults
- real time
- focal plane
- abnormal events
- image sensor
- fault detection and isolation
- knowledge base
- neural network