Login / Signup
Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy.
Said Hamdioui
Ad J. van de Goor
Published in:
J. Electron. Test. (2000)
Keyphrases
</>
test cases
fault model
test generation
fault models
test suite
test data
software testing
statistical tests
model based diagnosis
mutation testing
code coverage
fault diagnosis
item response theory
database
databases
knowledge representation