A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization.
Long ZhangLanfei YanZhenyu ZhangJian ZhangW. K. ChanZheng ZhengPublished in: J. Syst. Softw. (2017)
Keyphrases
- test cases
- software testing
- fault localization
- theoretical analysis
- test data
- test suite
- test case generation
- test sequences
- number of test cases
- program understanding
- regression testing
- quality assurance
- test generation
- software systems
- software development
- test data generation
- testing process
- software engineering
- test suite reduction
- artificial intelligence
- test case selection
- model based testing
- test set
- object oriented
- set of test cases