Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing - Future of Semiconductor Test.
Sunil R. DasRochit RajsumanPublished in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
- special section
- special issue
- test cases
- software testing
- test generation
- test data
- test sequences
- long term
- test suite
- database
- statistical tests
- data acquisition
- model based testing
- high speed
- signal processing
- test case generation
- mobile devices
- regression testing
- database transactions
- number of test cases
- test data generation
- testing process
- usability testing
- software development
- low cost
- software engineering
- databases