On automatic generation of RTL validation test benches using circuit testing techniques.
Indradeep GhoshSrivaths RaviPublished in: ACM Great Lakes Symposium on VLSI (2003)
Keyphrases
- model based testing
- test cases
- software testing
- test data generation
- test generation
- testing process
- high speed
- test sequences
- test data
- statistical tests
- automatically generate
- test suite
- test case generation
- hardware software co design
- database
- software development
- knowledge base
- information retrieval
- neural network
- number of test cases
- databases
- digital circuits
- usability testing
- data mining