Grain Segmentation in Atomic Force Microscopy for Thin-Film Deposition Quality Control.
Nicolò LanzaAlessandro RomeoMarco CristaniFrancesco SettiPublished in: ICIAP Workshops (2019)
Keyphrases
- thin film
- quality control
- atomic force microscopy
- machine vision
- quality assurance
- image segmentation
- high density
- manufacturing systems
- grain size
- short circuit
- multi layer
- film thickness
- chemical vapor deposition
- plasma etching
- manufacturing process
- solar cell
- segmentation algorithm
- automated visual inspection
- image processing
- product quality
- computer vision
- electron microscopy