Optimizing Test Hardware for At-Speed Testing of Datapaths in an Integrated Circuit.
Debashis BhattacharyaSmith FreemanBill LinPublished in: VLSI Design (1997)
Keyphrases
- hardware software co design
- high speed
- hardware and software
- real time
- test cases
- circuit design
- digital circuits
- test generation
- test sequences
- low cost
- software testing
- test data
- statistical tests
- test suite
- test data generation
- hw sw
- image processing
- field programmable gate array
- computer systems
- regression testing
- usability testing
- evolvable hardware
- test case generation
- testing process
- set of test cases
- model based testing
- item response theory
- test set
- personal computer
- processing speed