CMOS transistor faults and bridging faults: Testability by delay effects and overcurrents.
Uwe HübnerWolfgang MeyerHeinrich Theodor VierhausPublished in: Microprocess. Microprogramming (1992)
Keyphrases
- fault diagnosis
- high speed
- fault detection
- power dissipation
- low power
- multiple faults
- power consumption
- model based diagnosis
- test cases
- low cost
- neural network
- circuit design
- web services
- abnormal events
- fault detection and diagnosis
- fault model
- software systems
- steady state
- wireless sensor networks
- error detection
- root cause
- genetic algorithm