Login / Signup
On Low-Capture-Power Test Generation for Scan Testing.
Xiaoqing Wen
Yoshiyuki Yamashita
Seiji Kajihara
Laung-Terng Wang
Kewal K. Saluja
Kozo Kinoshita
Published in:
VTS (2005)
Keyphrases
</>
test generation
test cases
symbolic execution
test sequences
design automation
static analysis
software testing
mutation testing
quality assurance
code coverage
power consumption
test data generation
computer vision
source code
object oriented
cooperative
regression testing
image processing
e learning