On Low-Capture-Power Test Generation for Scan Testing.

Xiaoqing Wen Yoshiyuki Yamashita Seiji Kajihara Laung-Terng Wang Kewal K. Saluja Kozo Kinoshita

Published in: VTS (2005)

Keyphrases

test generation
test cases
symbolic execution
test sequences
design automation
static analysis
software testing
mutation testing
quality assurance
code coverage
power consumption
test data generation
computer vision
source code
object oriented
cooperative
regression testing
image processing
e learning