Detection of CMOS Bridging Faults by Stuck-At Fault Tests.
S. HwangRochit RajsumanScott DavidsonPublished in: VLSI Design (1994)
Keyphrases
- fault diagnosis
- fault detection
- fault model
- error detection
- fault detection and isolation
- high speed
- detection method
- test cases
- false alarms
- multiple faults
- object detection
- detection accuracy
- automatic detection
- detection rate
- power consumption
- detection algorithm
- data sets
- condition monitoring
- fault isolation
- repair actions
- event detection
- false positives
- low cost
- computer vision
- power plant
- low power
- single chip
- anomaly detection
- digital images
- fuzzy logic