At-speed interconnect testing and test-path optimization for 2.5D ICs.
Ran WangKrishnendu ChakrabartySudipta BhawmikPublished in: VTS (2014)
Keyphrases
- high speed
- test cases
- software testing
- test generation
- test data
- test suite
- statistical tests
- test case generation
- testing process
- optimization problems
- optimization algorithm
- data sets
- optimization process
- global optimization
- shortest path
- optimization model
- real time
- optimization method
- test sequences
- test data generation
- set of test cases
- statistical significance
- software development
- low cost
- case study
- usability testing
- decision trees
- integration testing