Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT.
Ghaith Bany HamadGhaith KazmaOtmane Aït MohamedYvon SavariaPublished in: IOLTS (2017)
Keyphrases
- comprehensive analysis
- built in self test
- fault models
- fault diagnosis
- steady state
- fault detection
- analog circuits
- analog vlsi
- high speed
- digital circuits
- test cases
- multimedia content analysis
- neural network
- multiple faults
- fault detection and isolation
- mac protocol
- delay insensitive
- electronic circuits
- fault model
- fault detection and diagnosis
- abnormal events
- logic circuits
- statistical machine translation
- sequential data
- infrared
- natural language