CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.
Hiroshi FurukawaXiaoqing WenKohei MiyaseYuta YamatoSeiji KajiharaPatrick GirardLaung-Terng WangMohammad TehranipoorPublished in: ATS (2008)