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CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.

Hiroshi FurukawaXiaoqing WenKohei MiyaseYuta YamatoSeiji KajiharaPatrick GirardLaung-Terng WangMohammad Tehranipoor
Published in: ATS (2008)
Keyphrases
  • test cases
  • software testing
  • power reduction
  • test data
  • power consumption
  • test generation
  • high speed
  • test suite
  • statistical tests
  • model checking
  • low power