testing of bridging faults in CMOS circuits.
S. Wayne BollingerScott F. MidkiffPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
- delay insensitive
- analog vlsi
- test cases
- high speed
- circuit design
- vlsi circuits
- fault model
- cmos technology
- fault diagnosis
- low cost
- fault models
- random access memory
- low voltage
- floating gate
- built in self test
- chip design
- power dissipation
- power supply
- low power
- multiple faults
- test data
- information technology
- root cause
- test generation
- software testing
- fault detection
- digital camera
- parallel processing
- power consumption
- mutation testing