A Defects Classification Algorithm for the Hybrid OBT-IDDQ Fault Diagnosis Technique in Analog CMOS Integrated Circuits.
Dejan MirkovicMilena Stanojlovic MirkovicMiljana MilicVladimir PetrovicPublished in: J. Circuits Syst. Comput. (2024)
Keyphrases
- classification algorithm
- fault diagnosis
- integrated circuit
- analog circuits
- analog vlsi
- printed circuit boards
- circuit design
- expert systems
- neural network
- fault detection
- fault detection and diagnosis
- k nearest neighbor
- metal oxide semiconductor
- fuzzy logic
- knn
- bp neural network
- condition monitoring
- naive bayes
- electronic equipment
- training set
- chemical process
- monitoring and fault diagnosis
- class labels
- power transformers
- concept drift
- gas turbine
- digital circuits
- learning algorithm
- multiple faults
- rotating machinery
- operating conditions
- power consumption
- low power
- low cost
- support vector machine
- multi sensor information fusion
- knowledge base
- classification method
- training data
- clustering algorithm
- image processing
- feature selection
- artificial intelligence