Adaptable Voltage Scan Testing of Charge-Sharing Faults for Domino Circuits.
Ching-Hwa ChengPublished in: DFT (2002)
Keyphrases
- test cases
- fault model
- low voltage
- information sharing
- built in self test
- neural network
- power system
- high voltage
- fault diagnosis
- charge coupled device
- high speed
- fault models
- computational intelligence
- tunnel diode
- delay insensitive
- test sequences
- model based diagnosis
- test set
- testing process
- asynchronous circuits
- power supply
- circuit design
- multiple users
- quantum computing
- transmission line
- fault detection
- data sharing