Testing Skew and Logic Faults in SoC Interconnects.
Nestor HernandezVíctor H. ChampacPublished in: ISVLSI (2008)
Keyphrases
- test cases
- fault model
- input output
- fault diagnosis
- built in self test
- predicate logic
- low power
- software testing
- computational properties
- fault detection
- modal logic
- neural network
- hardware and software
- data sets
- multi valued
- logical framework
- test generation
- test data
- fault detection and diagnosis
- fiber optic
- expert systems
- mutation testing