Dynamic Analog Testing via ATE Digital Test Channels.
C. C. SuC. S. ChangH. W. HuangD. S. TuC. L. LeeJerry C. H. LinPublished in: Asian Test Symposium (2004)
Keyphrases
- test cases
- multi channel
- test suite
- mixed signal
- software testing
- test data
- test sequences
- test generation
- data sets
- signal processing
- integration testing
- test case generation
- dynamic environments
- digital circuits
- usability testing
- testing process
- test data generation
- data conversion
- set of test cases
- cmos image sensor
- regression testing
- circuit design
- communication channels
- statistical tests
- website