High-Level Test Synthesis With Hierarchical Test Generation for Delay-Fault Testability.
Sying-Jyan WangTung-Hua YehPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)
Keyphrases
- test generation
- test data generation
- high level
- test cases
- software testing
- test sequences
- low level
- symbolic execution
- design automation
- static analysis
- quality assurance
- code coverage
- mutation testing
- source code
- regression testing
- fault diagnosis
- testing process
- computer vision
- test suite
- relational databases
- information technology