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Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints.
Taavi Viilukas
Anton Karputkin
Jaan Raik
Maksim Jenihhin
Raimund Ubar
Hideo Fujiwara
Published in:
J. Electron. Test. (2012)
Keyphrases
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built in self test
test cases
integrated circuit
high speed
constraint programming
endpoints
analog vlsi
circuit design
database
test data
fault diagnosis
shortest path
neural network
statistical tests
constrained optimization
fault detection
statistical significance
asynchronous circuits
delay insensitive