A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices.
Bernd LaquaiPublished in: ITC (2004)
Keyphrases
- high speed
- low power
- test cases
- hardware software co design
- test data
- test sequences
- mobile devices
- test generation
- software testing
- regression testing
- embedded systems
- test data generation
- test case generation
- testing process
- code coverage
- statistical tests
- real time
- learning phase
- intelligent environments
- test suite
- personal computer
- hardware and software
- context aware
- item response theory
- testing phase
- video sequences
- artificial intelligence
- model based testing
- set of test cases
- database