Testing Disturbance Faults in Various NAND Flash Memories.

Chih-Sheng Hou Jin-Fu Li

Published in: J. Electron. Test. (2014)

Keyphrases

test cases
fault model
fault diagnosis
fault detection
test suite
software testing
information systems
associative memory
root cause
flash memory
model based diagnosis
mutation testing
multiple faults
test sequences
neural network
low power
low cost
case study
learning algorithm