Test Sequences for Faults in the Scan Logic.
Irith PomeranzPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2022)
Keyphrases
- test sequences
- test cases
- mutation testing
- video sequences
- test generation
- bit rate
- built in self test
- three dimensional
- classical logic
- fault diagnosis
- multi valued
- fault detection
- logic programming
- test suite
- software testing
- data model
- data sets
- database
- regular expressions
- test set
- root cause
- scan data
- multiple faults
- machine learning