Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing - Future of Semiconductor Test.
Sunil R. DasRochit RajsumanPublished in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
- special section
- special issue
- test cases
- software testing
- test generation
- test suite
- test data
- database
- test sequences
- statistical tests
- regression testing
- signal processing
- long term
- award winning
- testing process
- test data generation
- databases
- data acquisition
- high speed
- credit card
- concurrency control
- usability testing
- vlsi design
- real world
- model based testing
- number of test cases