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Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing - Future of Semiconductor Test.
Sunil R. Das
Rochit Rajsuman
Published in:
IEEE Trans. Instrum. Meas. (2006)
Keyphrases
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test cases
software testing
test generation
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test data
database
test sequences
statistical tests
regression testing
signal processing
long term
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databases
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high speed
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number of test cases