Path coverage based functional test generation for processor marginality validation.
Suriyaprakash NatarajanArun KrishnamacharyEli ChiproutRajesh GalivanchePublished in: ITC (2010)
Keyphrases
- test generation
- code coverage
- test cases
- functional verification
- design automation
- static analysis
- test suite
- quality assurance
- symbolic execution
- high speed
- test sequences
- software testing
- shortest path
- parallel processing
- regression testing
- mutation testing
- image data
- test data generation
- artificial intelligence
- databases
- data sets
- metadata