Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits.
Eugeni IsernJoan FiguerasPublished in: ITC (1993)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- design automation
- software testing
- symbolic execution
- test data generation
- quality assurance
- static analysis
- built in self test
- test suite
- fault diagnosis
- regression testing
- code coverage
- test set
- high speed
- case study
- databases
- asynchronous circuits
- object oriented
- artificial intelligence
- database