Fault Coverage and Test Length Estimation for Random Pattern Testing.
Amitava MajumdarSarma B. K. VrudhulaPublished in: IEEE Trans. Computers (1995)
Keyphrases
- test cases
- test generation
- software testing
- test sequences
- statistical tests
- test data
- test suite
- pattern matching
- estimation algorithm
- regression testing
- testing process
- integration testing
- set of test cases
- information systems
- model based testing
- test case generation
- usability testing
- uniformly distributed
- maximum likelihood estimation
- pattern discovery
- test set
- probability distribution