On Decomposing Complex Test Cases for Efficient Post-silicon Validation.
C. HarshithaSundarapalli HarikrishnaPeddakotla RohithSandeep ChandranRajshekar KalayappanPublished in: ASPDAC (2024)
Keyphrases
- test cases
- model based testing
- software testing
- test data
- test suite
- test sequences
- regression testing
- test case generation
- test case selection
- test data generation
- testing process
- test generation
- test set
- real world
- test suite reduction
- relational databases
- data sets
- software maintenance
- error rate
- software development
- training data
- high level
- decision trees
- learning algorithm
- number of test cases
- set of test cases
- machine learning