A New Spectrum-based Fault Localization With the Technique of Test Case Optimization.
Jeongho KimJonghee ParkEunseok LeePublished in: J. Inf. Sci. Eng. (2016)
Keyphrases
- test cases
- fault localization
- software testing
- test case generation
- program understanding
- test data
- regression testing
- test suite
- test sequences
- test generation
- test case selection
- program slicing
- test data generation
- software engineering
- object oriented
- number of test cases
- testing process
- fault detection
- model based diagnosis
- test set
- software development
- test suite reduction
- development process
- learning algorithm
- neural network
- data sets