TOOL WEAR
Experts
- Han Ding
- Michael Barton
- Rodolfo E. Haber
- Kunpeng Zhu
- Congbo Li
- Kai Tang
- Geok Soon Hong
- Pingyu Jiang
- Ming Luo
- Keiichi Shirase
- Chih-Hsing Chu
- Berend Denkena
- Ying Tang
- Steven Y. Liang
- Fritz Klocke
- Dinghua Zhang
- Andrés Bustillo
- Azlan Mohd Zain
- Yoke San Wong
- Qun Ren
- Anthony D. Hope
- Gary D. Bernard
- Pan Fu
- Marek Balazinski
- Habibollah Haron
- Roque Alfredo Osornio-Rios
- Rubén Morales-Menéndez
- Junhong Zhou
- Stephen D. J. McArthur
- Hongli Gao
- Yuan-Shin Lee
- Sang C. Park
- Luc Baron
- Ada Fort
- Michal Bizzarri
- Guanghui Zhou
- José R. Alique
- Yasuhiro Kakinuma
- Mamoru Mitsuishi
Venues
- Sensors
- Int. J. Autom. Technol.
- Comput. Aided Des.
- CoRR
- J. Intell. Manuf.
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Prod. Eng.
- Int. J. Manuf. Res.
- Int. J. Comput. Integr. Manuf.
- Remote. Sens.
- IEEE Trans. Ind. Electron.
- Expert Syst. Appl.
- IGARSS
- Int. J. Manuf. Technol. Manag.
- CASE
- Robotics Comput. Integr. Manuf.
- IECON
- I2MTC
- Appl. Soft Comput.
- Comput. Ind. Eng.
- Reliab. Eng. Syst. Saf.
- Eng. Appl. Artif. Intell.
- Comput. Ind.
- ICRA
- ETFA
- ICIRA (2)
- IEEE Trans. Ind. Informatics
- Qual. Reliab. Eng. Int.
- Simul. Model. Pract. Theory
- Neural Comput. Appl.
- Int. J. Prod. Res.
- EMBC
- AIM
- SMC
- ICPHM
- IEEE SENSORS
- ICASSP
- Comput. Aided Geom. Des.
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