TOOL WEAR
Experts
- Han Ding
- Kunpeng Zhu
- Michael Barton
- Rodolfo E. Haber
- Geok Soon Hong
- Kai Tang
- Congbo Li
- Chih-Hsing Chu
- Pingyu Jiang
- Ming Luo
- Keiichi Shirase
- Berend Denkena
- Steven Y. Liang
- Dinghua Zhang
- Fritz Klocke
- Ying Tang
- Azlan Mohd Zain
- Andrés Bustillo
- Stephen D. J. McArthur
- Marek Balazinski
- Yuan-Shin Lee
- Yoke San Wong
- Qun Ren
- Gary D. Bernard
- Pan Fu
- Habibollah Haron
- Hongli Gao
- Anthony D. Hope
- Junhong Zhou
- Rubén Morales-Menéndez
- Roque Alfredo Osornio-Rios
- Keiichi Nakamoto
- Yasuhiro Kakinuma
- Xiaoli Li
- Naohiko Sugita
- Safian Sharif
- Jose A. Antonino-Daviu
- Luc Baron
- Miguel Trejo-Hernandez
Venues
- Sensors
- Int. J. Autom. Technol.
- CoRR
- Comput. Aided Des.
- J. Intell. Manuf.
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Prod. Eng.
- Int. J. Manuf. Res.
- Int. J. Comput. Integr. Manuf.
- Remote. Sens.
- IEEE Trans. Ind. Electron.
- Expert Syst. Appl.
- Robotics Comput. Integr. Manuf.
- IGARSS
- I2MTC
- CASE
- Int. J. Manuf. Technol. Manag.
- IECON
- Eng. Appl. Artif. Intell.
- Comput. Ind. Eng.
- Reliab. Eng. Syst. Saf.
- Appl. Soft Comput.
- Comput. Ind.
- ICRA
- IEEE Trans. Ind. Informatics
- ETFA
- Qual. Reliab. Eng. Int.
- ICIRA (2)
- Simul. Model. Pract. Theory
- Neural Comput. Appl.
- Int. J. Prod. Res.
- EMBC
- AIM
- SMC
- ICPHM
- IEEE SENSORS
- Comput. Aided Geom. Des.
- ICASSP
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