TOF CAMERA
Experts
- Andreas Kolb
- Joachim Hornegger
- Norbert Druml
- Felix Heide
- Lee V. Streeter
- Ramesh Raskar
- Gerald Holweg
- Christian Steger
- Miguel Heredia Conde
- Bruno Mirbach
- Erhardt Barth
- Jochen Penne
- Reinhard Koch
- Michael J. Cree
- Adrian A. Dorrington
- Otmar Loffeld
- Ayush Bhandari
- Manuel Mazo
- Matthias B. Hullin
- Achuta Kadambi
- Lena Maier-Hein
- Bedrich J. Hosticka
- Domenico Giustiniano
- Dirk Holz
- Wolfgang Heidrich
- Shoji Kawahito
- Didier Stricker
- Hannes Plank
- David Droeschel
- Ruigang Yang
- Nassir Navab
- Hans-Peter Meinzer
- Thomas Martinetz
- Martin Haker
- Jason R. Rambach
- Rasmus Larsen
- Martin Böhme
- Radu Horaud
- Gordon Wetzstein
Venues
- CoRR
- Sensors
- CVPR
- IEEE Trans. Instrum. Meas.
- CVPR Workshops
- IEEE SENSORS
- ICIP
- IROS
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- ISCAS
- IEEE Access
- DSD
- 3DV
- Dyn3D
- Int. J. Intell. Syst. Technol. Appl.
- ICCV
- Bildverarbeitung für die Medizin
- I2MTC
- Comput. Vis. Image Underst.
- WACV
- IPIN
- IVCNZ
- VISAPP (1)
- VMV
- ICPR
- RoboCup
- ESSCIRC
- Expert Syst. Appl.
- Remote. Sens.
- Image Vis. Comput.
- Time-of-Flight and Depth Imaging
- Three-Dimensional Image Processing (3DIP) and Applications
- IEEE Trans. Medical Imaging
- MWSCAS
- ICASSP
- IEEE J. Solid State Circuits
- ECCTD
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