SURFACE CURVATURE
Experts
- Jörg Peters
- Kestutis Karciauskas
- Kenjiro T. Miura
- Jonathan Kelly
- Valentin Peretroukhin
- Gershon Elber
- Katsushi Ikeuchi
- Jean-Claude Léon
- Weizhong Zhang
- Daniel T. L. Lee
- Banghua Zhu
- Chang-Hun Kim
- Hans-Peter Seidel
- Nasser Khalili
- Marc Alexa
- Helmut Pottmann
- Bikash Sabata
- Patrick J. Flynn
- Farzin Mokhtarian
- Rhema Linder
- Lawrence B. Wolff
- Ya-Liang Chang
- Andrew M. Webb
- Winston H. Hsu
- Daniel Barath
- Hui Chen
- Gérard G. Medioni
- Robert J. Woodham
- Marc Pollefeys
- Peter Yuen
- Hiromi T. Tanaka
- Martial Hebert
- Kim L. Boyer
- Xiaoping Wang
- Charlie C. L. Wang
- Pavel Cízek
- Jacques-Olivier Lachaud
- Jiantao Jiao
- Bir Bhanu
Venues
- CoRR
- Comput. Aided Des.
- Comput. Aided Geom. Des.
- CVPR
- ICRA
- ICCV
- Comput. Vis. Image Underst.
- Comput. Graph.
- Comput. Graph. Forum
- Sensors
- IROS
- Pattern Recognit.
- Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACC
- ACM Trans. Graph.
- SIGGRAPH
- Comput. Stat. Data Anal.
- ITSC
- Appl. Math. Comput.
- ICPR (1)
- Symposium on Solid Modeling and Applications
- 3DIM
- IEEE Visualization
- IEEE Trans. Signal Process.
- SIAM J. Appl. Math.
- CAD/Graphics
- ICASSP
- IGARSS
- Comput. Vis. Graph. Image Process.
- ICPR
- CDC
- MVA
- Int. J. Comput. Vis.
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Math. Appl.
- EUSIPCO
- J. Comput. Chem.
- IEEE Trans. Instrum. Meas.
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