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Experts
- Luc Van Gool
- Hans-Peter Seidel
- Katsushi Ikeuchi
- Yonghuai Liu
- Gérard G. Medioni
- Robert B. Fisher
- Pascal Fua
- Marc Pollefeys
- Adrian Hilton
- Angel Domingo Sappa
- Changqing Zhang
- Hideo Saito
- Luciano Silva
- Ryusuke Sagawa
- Long Quan
- Christian Theobalt
- Philip S. Yu
- Olga Regina Pereira Bellon
- Mohammed Bennamoun
- Jihua Zhu
- Wolfram Burgard
- Markus Vincze
- Roberto Cipolla
- Hujun Bao
- Thomas S. Huang
- Edwin R. Hancock
- Ales Leonardis
- Ruigang Yang
- Qionghai Dai
- Kevin W. Bowyer
- Hongbin Zha
- Daniel Cohen-Or
- Zhongyu Li
- Huijing Zhao
- Ross T. Whitaker
- Jean Ponce
- Matthias Nießner
- Xiaoyi Jiang
- Mongi A. Abidi
Venues
- CoRR
- CVPR
- Sensors
- ICRA
- ICCV
- IEEE Access
- IROS
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- ICPR
- Pattern Recognit.
- Comput. Aided Des.
- Comput. Graph. Forum
- ACM Trans. Graph.
- Comput. Graph.
- Vis. Comput.
- IGARSS
- IEEE Trans. Image Process.
- Comput. Aided Geom. Des.
- BMVC
- ICASSP
- EMBC
- Image Vis. Comput.
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Comput. Vis.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Vis. Comput. Graph.
- IEEE Trans. Medical Imaging
- J. Comput. Phys.
- J. Electronic Imaging
- Comput. Vis. Image Underst.
- Neurocomputing
- 3DIM
- AAAI
- Multim. Tools Appl.
- ISBI
- Pattern Recognit. Lett.
- CVPR Workshops
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