ORTHOGRAPHIC PROJECTION
Experts
- Guanghui Wang
- Q. M. Jonathan Wu
- Jianzhuang Liu
- Kevin W. Bowyer
- Ziv Gigus
- Xiaoou Tang
- Paul A. Beardsley
- Myung-Soo Kim
- Levente Hajder
- Robert M. Haralick
- Andrew Zisserman
- Jitendra Malik
- Thomas S. Huang
- Chunyu Wang
- Arun N. Netravali
- Richard Szeliski
- Sing Bing Kang
- Richard E. Parent
- Pedro Miraldo
- David William Murray
- Liangliang Cao
- Yizhou Wang
- Wentao Zhu
- Pedro U. Lima
- Robert J. Holt
- Christopher G. Harris
- Guoqiang Sun
- Xiaoping Hu
- A. Pedro Aguiar
- Alfred M. Bruckstein
- Stephan R. Richter
- Anders Heyden
- Stefan Roth
- Takeshi Shakunaga
- Jonathan Ventura
- Gershon Elber
- John F. Hughes
- Rujie Wu
- Yong-Joon Kim
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- Pattern Recognit. Lett.
- CVPR
- Int. J. Comput. Vis.
- Comput. Graph.
- ICPR
- ICCV
- ICRA
- Pattern Recognit.
- Systems and Computers in Japan
- Vis. Comput.
- Comput. Aided Geom. Des.
- WACV
- ECCV (2)
- Comput. Vis. Graph. Image Process.
- Remote. Sens.
- MVA
- Symmetry
- ECCV (1)
- ICIP
- SIGGRAPH
- IROS
- ICCV Workshops
- VISAPP (1)
- BMVC
- ICPR (1)
- ACM Trans. Graph.
- IEEE Access
- ICPR (3)
- ACCV (2)
- ICETET
- 3DIMPVT
- ECCV (6)
- SSD
- ICSIPA
- IbPRIA
- Proc. ACM Interact. Mob. Wearable Ubiquitous Technol.
- Signal Process.
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