OBJECT CONTOURS
Experts
- Stephen M. Pizer
- Vincent Lepetit
- Xueying Qin
- Fan Zhong
- Xiang Bai
- Steven L. Waslander
- Yinlin Hu
- Yu Xiang
- Mathieu Salzmann
- Jie Zhou
- Fangbo Qin
- Luca Serino
- Domenec Puig
- Minoru Asada
- Santiago Romani
- Wen Gao
- Hui Tang
- Md. Mostafa Kamal Sarker
- Gabriella Sanniti di Baja
- Longin Jan Latecki
- Farhan Akram
- Romain Brégier
- Adel Saleh
- Masayoshi Tomizuka
- Vivek Kumar Singh
- Jun Wang
- Jihun Park
- Hatem A. Rashwan
- Jiwen Lu
- Pascal Fua
- Cheng-Ting Liu
- Dimitris N. Metaxas
- Dieter Fox
- Tae-Kyun Kim
- Luc Van Gool
- Roy Chaoming Hsu
- Udo Zölzer
- Yoshiaki Shirai
- Nidhi Pandey
Venues
- CoRR
- CVPR
- ICRA
- ICCV
- ICIP
- Pattern Recognit.
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ICASSP
- IEEE Access
- IROS
- BMVC
- ICPR
- Multim. Tools Appl.
- ISBI
- ICIP (3)
- Image Vis. Comput.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Robotics Autom. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- SCIA
- Remote. Sens.
- Vis. Comput.
- ROBIO
- Sensors
- IEEE Trans. Medical Imaging
- IEICE Trans. Inf. Syst.
- AAAI
- SMC
- J. Vis. Commun. Image Represent.
- Int. J. Comput. Vis.
- MVA
- Neurocomputing
- CIARP
- IV
- IJCAI
- Comput. Vis. Image Underst.
- ICME
- DGCI
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