OBJECT CONTOURS
Experts
- Stephen M. Pizer
- Vincent Lepetit
- Fan Zhong
- Xueying Qin
- Xiang Bai
- Yu Xiang
- Steven L. Waslander
- Mathieu Salzmann
- Yinlin Hu
- Masayoshi Tomizuka
- Udo Zölzer
- Gabriella Sanniti di Baja
- Dimitris N. Metaxas
- Jun Wang
- Wen Gao
- Fangbo Qin
- Jordina Torrents-Barrena
- Hui Tang
- Tae-Kyun Kim
- Jihun Park
- Daniel Ritchie
- Adel Saleh
- Luc Van Gool
- André Peter Kelm
- Santiago Romani
- Vivek Kumar Singh
- Hatem A. Rashwan
- Domenec Puig
- Dieter Fox
- Cheng-Ting Liu
- Jiwen Lu
- Meritxell Arenas
- Longin Jan Latecki
- Jie Zhou
- Farhan Akram
- Luca Serino
- Yoshiaki Shirai
- Md. Mostafa Kamal Sarker
- Slobodan Ilic
Venues
- CoRR
- CVPR
- ICRA
- ICIP
- ICCV
- Pattern Recognit.
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ICASSP
- IEEE Access
- IROS
- BMVC
- ICPR
- Multim. Tools Appl.
- ICIP (3)
- Image Vis. Comput.
- ISBI
- IEEE Robotics Autom. Lett.
- IEEE Trans. Geosci. Remote. Sens.
- SCIA
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- Sensors
- ROBIO
- Vis. Comput.
- IEEE Trans. Medical Imaging
- IV
- IEICE Trans. Inf. Syst.
- AAAI
- J. Vis. Commun. Image Represent.
- SMC
- CIARP
- Int. J. Comput. Vis.
- MVA
- IJCAI
- Neurocomputing
- WACV
- Comput. Vis. Image Underst.
- DGCI
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