MULTI VIEW GEOMETRY
Experts
- Tomás Pajdla
- Peter F. Sturm
- J. Rafael Sendra
- Jun Sato
- Pavel Rojtberg
- Zuzana Kukelova
- Zhengyou Zhang
- Juan Gerardo Alcázar
- Jean Ponce
- Zhanyi Hu
- Chaoping Xing
- Fuchao Wu
- Alexander Barg
- Hui Zhang
- Juana Sendra
- Imran N. Junejo
- Wolfgang Förstner
- Helder Araújo
- Long Quan
- Michal Polic
- Miroslav Lávicka
- Yuncai Liu
- Aly A. Farag
- Carlos Ricolfe-Viala
- Jan Vrsek
- Gabriel Taubin
- Kwan-Yee Kenneth Wong
- Yee-Hong Yang
- Ryutaroh Matsumoto
- Guo-Qing Wei
- Yi-Ping Hung
- Hanqi Zhuang
- Matthew Trager
- Marc Pollefeys
- Ganesan Ramalingam
- Romil Bhardwaj
- Song De Ma
- Frank de Zeeuw
- Serge G. Vladut
Venues
- CoRR
- ICCV
- CVPR
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- ICRA
- Pattern Recognit.
- Comput. Aided Geom. Des.
- J. Symb. Comput.
- IEEE Trans. Inf. Theory
- Mach. Vis. Appl.
- Sensors
- ICPR (1)
- ICIP
- IROS
- IEEE Access
- Pattern Recognit. Lett.
- MVA
- VISIGRAPP (4: VISAPP)
- Comput. Vis. Image Underst.
- J. Comput. Appl. Math.
- ICASSP
- ISSAC
- CVPR Workshops
- IEEE Trans. Image Process.
- ICIP (2)
- Int. J. Comput. Vis.
- Image Vis. Comput.
- ECCV (2)
- IEEE Trans. Instrum. Meas.
- ACCV (2)
- IEEE Trans. Robotics Autom.
- CVPR (1)
- WACV
- AVSS
- ITSC
- IMA Conference on the Mathematics of Surfaces
- ICONIP (2)
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