MULTI VIEW GEOMETRY
Experts
- Tomás Pajdla
- Peter F. Sturm
- J. Rafael Sendra
- Pavel Rojtberg
- Zuzana Kukelova
- Zhengyou Zhang
- Juan Gerardo Alcázar
- Jun Sato
- Chaoping Xing
- Fuchao Wu
- Zhanyi Hu
- Jean Ponce
- Carlos Ricolfe-Viala
- Yuncai Liu
- Alexander Barg
- Helder Araújo
- Gabriel Taubin
- Miroslav Lávicka
- Juana Sendra
- Kwan-Yee Kenneth Wong
- Jan Vrsek
- Wolfgang Förstner
- Hui Zhang
- Michal Polic
- Imran N. Junejo
- Long Quan
- Aly A. Farag
- Yee-Hong Yang
- Serge G. Vladut
- Torsten Sattler
- Andrea Torsello
- Itzhak Tamo
- Kosuke Takahashi
- Guo-Qing Wei
- Sonia Pérez-Díaz
- Andrew W. Fitzgibbon
- Fay Huang
- Kai Jin
- Mariko Isogawa
Venues
- CoRR
- ICCV
- CVPR
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- BMVC
- Comput. Aided Geom. Des.
- Pattern Recognit.
- Sensors
- IEEE Trans. Inf. Theory
- J. Symb. Comput.
- Mach. Vis. Appl.
- ICPR (1)
- IEEE Access
- ICIP
- IROS
- J. Comput. Appl. Math.
- ICASSP
- MVA
- IEEE Trans. Instrum. Meas.
- Comput. Vis. Image Underst.
- WACV
- Pattern Recognit. Lett.
- VISIGRAPP (4: VISAPP)
- CVPR Workshops
- Int. J. Comput. Vis.
- ECCV (2)
- ISSAC
- IEEE Trans. Image Process.
- Image Vis. Comput.
- ICIP (2)
- 3DPVT
- ICONIP (2)
- IMA Conference on the Mathematics of Surfaces
- IEICE Trans. Inf. Syst.
- ECCV (1)
- AVSS
- ITSC
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