MULTI VIEW GEOMETRY
Experts
- Tomás Pajdla
- Peter F. Sturm
- J. Rafael Sendra
- Zhengyou Zhang
- Pavel Rojtberg
- Jun Sato
- Zuzana Kukelova
- Juan Gerardo Alcázar
- Jean Ponce
- Fuchao Wu
- Zhanyi Hu
- Chaoping Xing
- Miroslav Lávicka
- Imran N. Junejo
- Gabriel Taubin
- Long Quan
- Kwan-Yee Kenneth Wong
- Wolfgang Förstner
- Helder Araújo
- Yuncai Liu
- Jan Vrsek
- Alexander Barg
- Hui Zhang
- Juana Sendra
- Aly A. Farag
- Michal Polic
- Carlos Ricolfe-Viala
- Kosuke Takahashi
- Roberto Cipolla
- Reinhard Klette
- Frank de Zeeuw
- Antonio-José Sánchez-Salmerón
- Ryutaroh Matsumoto
- Andrea Albarelli
- Yawen Lu
- Romil Bhardwaj
- Hassan Foroosh
- Yee-Hong Yang
- Hanqi Zhuang
Venues
- CoRR
- ICCV
- ICPR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Comput. Aided Geom. Des.
- BMVC
- Sensors
- Pattern Recognit.
- IEEE Trans. Inf. Theory
- Mach. Vis. Appl.
- J. Symb. Comput.
- ICPR (1)
- IEEE Access
- IROS
- ICIP
- Comput. Vis. Image Underst.
- IEEE Trans. Instrum. Meas.
- ICASSP
- WACV
- MVA
- Pattern Recognit. Lett.
- VISIGRAPP (4: VISAPP)
- J. Comput. Appl. Math.
- Int. J. Comput. Vis.
- ISSAC
- ECCV (2)
- IEEE Trans. Image Process.
- Image Vis. Comput.
- CVPR Workshops
- ICIP (2)
- AVSS
- IEICE Trans. Inf. Syst.
- CVPR (1)
- 3DPVT
- ITSC
- IMA Conference on the Mathematics of Surfaces
- IEEE Trans. Robotics Autom.
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