MULTI VIEW GEOMETRY
Experts
- Tomás Pajdla
- J. Rafael Sendra
- Peter F. Sturm
- Juan Gerardo Alcázar
- Zhengyou Zhang
- Pavel Rojtberg
- Jun Sato
- Zuzana Kukelova
- Zhanyi Hu
- Chaoping Xing
- Jean Ponce
- Fuchao Wu
- Wolfgang Förstner
- Helder Araújo
- Yuncai Liu
- Imran N. Junejo
- Kwan-Yee Kenneth Wong
- Juana Sendra
- Miroslav Lávicka
- Michal Polic
- Alexander Barg
- Jan Vrsek
- Carlos Ricolfe-Viala
- Long Quan
- Aly A. Farag
- Gabriel Taubin
- Hui Zhang
- Hassan Foroosh
- Edmond Boyer
- Song De Ma
- Frank de Zeeuw
- Kai Jin
- Fumihiko Sakaue
- Yawen Lu
- Jean-Marc Lavest
- Torsten Sattler
- João Pedro Barreto
- Prasun Sinha
- Kosuke Takahashi
Venues
- CoRR
- ICCV
- ICPR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Comput. Aided Geom. Des.
- BMVC
- Pattern Recognit.
- Sensors
- J. Symb. Comput.
- IEEE Trans. Inf. Theory
- Mach. Vis. Appl.
- ICPR (1)
- IROS
- ICIP
- IEEE Access
- MVA
- VISIGRAPP (4: VISAPP)
- J. Comput. Appl. Math.
- Pattern Recognit. Lett.
- ICASSP
- WACV
- IEEE Trans. Instrum. Meas.
- Comput. Vis. Image Underst.
- CVPR Workshops
- ICIP (2)
- ECCV (2)
- Image Vis. Comput.
- ISSAC
- Int. J. Comput. Vis.
- IEEE Trans. Image Process.
- 3DPVT
- ISBI
- ECCV (1)
- ICONIP (2)
- CVPR (1)
- AVSS
- ITSC
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