MULTI VIEW GEOMETRY
Experts
- Tomás Pajdla
- J. Rafael Sendra
- Peter F. Sturm
- Zuzana Kukelova
- Zhengyou Zhang
- Pavel Rojtberg
- Jun Sato
- Juan Gerardo Alcázar
- Chaoping Xing
- Fuchao Wu
- Zhanyi Hu
- Jean Ponce
- Wolfgang Förstner
- Michal Polic
- Carlos Ricolfe-Viala
- Jan Vrsek
- Aly A. Farag
- Juana Sendra
- Alexander Barg
- Kwan-Yee Kenneth Wong
- Gabriel Taubin
- Long Quan
- Miroslav Lávicka
- Helder Araújo
- Yuncai Liu
- Hui Zhang
- Imran N. Junejo
- Sonia Pérez-Díaz
- Song De Ma
- Hassan Foroosh
- Fumihiko Sakaue
- Hanqi Zhuang
- Roberto Cipolla
- Guo-Qing Wei
- Andrew W. Fitzgibbon
- Tian Fang
- Hideo Saito
- Sheng-Wen Shih
- Moumen T. Ahmed
Venues
- CoRR
- ICCV
- CVPR
- ICPR
- ICRA
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Aided Geom. Des.
- BMVC
- Pattern Recognit.
- Sensors
- Mach. Vis. Appl.
- J. Symb. Comput.
- IEEE Trans. Inf. Theory
- ICPR (1)
- ICIP
- IROS
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Comput. Vis. Image Underst.
- VISIGRAPP (4: VISAPP)
- Pattern Recognit. Lett.
- WACV
- ICASSP
- J. Comput. Appl. Math.
- MVA
- Int. J. Comput. Vis.
- ICIP (2)
- ECCV (2)
- ISSAC
- Image Vis. Comput.
- IEEE Trans. Image Process.
- CVPR Workshops
- ITSC
- 3DPVT
- ICONIP (2)
- AVSS
- IEEE Trans. Robotics Autom.
- ECCV (1)
- CVPR (1)
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