MODEL BASED RECOGNITION
Experts
- Thomas Seel
- Bijan Shirinzadeh
- Todd A. Cass
- Marc Pollefeys
- W. Eric L. Grimson
- Eduardo Bayro-Corrochano
- Wenguang Mao
- Josef Sivic
- Lili Qiu
- Shihui Guo
- Guohao Nie
- Hwee Choo Liaw
- Bogdan Alecu
- Ignacio Rocco
- Daniel P. Huttenlocher
- Relja Arandjelovic
- Huanlong Zhang
- Viktor Zamaraev
- Katsushi Ikeuchi
- Isaac Weiss
- Vadim V. Lozin
- Madasu Hanmandlu
- Jiawei Fang
- Dominique de Werra
- Jonathan R. Corney
- Hongbo Fu
- Yan Gao
- Yunting Zhang
- Dov Dori
- Sung Woo Park
- Siyuan Dong
- Teddy Furon
- Zhi-Qiang Liu
- Ahmet Iscen
- Shyamnath Gollakota
- Alberto Rodriguez
- Marc J. van Kreveld
- Jiliang Wang
- Keith D. Baker
Venues
- CoRR
- CVPR
- Sensors
- ICRA
- Int. J. Comput. Vis.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- Pattern Recognit. Lett.
- ICASSP
- MobiCom
- Pattern Recognit.
- ICPR
- Vis. Comput.
- ICDAR
- ECCV
- J. Electronic Imaging
- IEEE Trans. Mob. Comput.
- SMC
- ICCV
- MVA
- Medical Imaging: Image-Guided Procedures
- ISVC (2)
- SenSys
- ROBIO
- ISBI
- IEEE Robotics Autom. Lett.
- Proc. ACM Interact. Mob. Wearable Ubiquitous Technol.
- FUSION
- ICMC
- CVPR Workshops
- CHI
- ICIP (1)
- BMVC
- IEEE Trans. Ind. Electron.
- ACM Trans. Graph.
- CogSci
- ACM Trans. Sens. Networks
- ACC
- MFI
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