KEY INGREDIENT
Experts
- Torsten Sattler
- Leif Kobbelt
- Weisi Lin
- Juha Ylioinas
- Marc Pollefeys
- Wentao Cheng
- Bastian Leibe
- Juho Kannala
- Rashid Ansari
- Weifu Chen
- Guocan Feng
- Mengnan Du
- Mahdi Salarian
- Antonino Furnari
- Huiqi Deng
- Giovanni Maria Farinella
- Xia Hu
- Xinfeng Zhang
- Na Zou
- Guoyu Lu
- Mohammed Bennamoun
- Ming Cheng
- Sing Bing Kang
- Gregory Dudek
- Sebastiano Battiato
- Chandra Kambhamettu
- Florian Walch
- Ming-Ting Sun
- Kan Chen
- Hyun Myung
- Daniel Cremers
- Hanjiang Hu
- Johannes L. Schönberger
- Laura Leal-Taixé
- Sudipta N. Sinha
- Sebastian Hilsenbeck
- Hesheng Wang
- Xiaocheng Shang
- Xiaotian Li
Venues
- CoRR
- J. Comput. Phys.
- ICCV
- CVPR
- ICRA
- IEEE Access
- IROS
- Sensors
- ISM
- IEEE Trans. Instrum. Meas.
- BMVC
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- BMC Bioinform.
- IEEE Trans. Circuits Syst. Video Technol.
- AAAI
- URAI
- Pattern Recognit. Lett.
- EURASIP J. Wirel. Commun. Netw.
- Künstliche Intell.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IMECS
- Comput. Graph. Forum
- ISVC (1)
- IPAS
- ICME Workshops
- Auton. Robots
- ICDAR
- Comput. Graph.
- CVPR (2)
- ICINCO
- Frontiers Artif. Intell.
- Frontiers Neurorobotics
- J. Comput. Chem.
- RACS
- CHI Extended Abstracts
- EMBC
- IEEE Trans. Control. Syst. Technol.
- IEEE Symposium on Computer Arithmetic
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