ASPECT GRAPH
Experts
- Kevin W. Bowyer
- Ziv Gigus
- Jianzhuang Liu
- Jean Ponce
- David W. Eggert
- Jitendra Malik
- François X. Sillion
- Katsushi Ikeuchi
- Attawith Sudsang
- Xiaoou Tang
- Martin C. Cooper
- Seok-Hee Hong
- David A. Castelow
- Bernard F. Buxton
- David William Murray
- Josef Kittler
- Charles R. Dyer
- Kok Cheong Wong
- Hiroshi Nagamochi
- P. Y. Mok
- Jean-Yves Ramel
- Yu Cao
- Henrik I. Christensen
- Hongbin Zha
- Ernesto Staffetti
- John H. Stewman
- Utpal Roy
- Hubert Emptoz
- Renju Li
- Jing Xiao
- Gen-ichiro Kinoshita
- Dmitry B. Goldgof
- Takashi Suehiro
- Paul H. Lewis
- Sukhan Lee
- Pascal Barla
- Vishvjit S. Nalwa
- Raimund Seidel
- Seungyong Lee
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Int. J. Comput. Vis.
- CVPR
- CoRR
- Comput. Aided Des.
- Pattern Recognit. Lett.
- Pattern Recognit.
- ICCV
- Image Vis. Comput.
- ICPR
- IROS
- SIGGRAPH
- Vis. Comput.
- Artif. Intell.
- ICME
- SMC
- ACM Comput. Surv.
- Graph Drawing
- BMVC
- Int. J. Pattern Recognit. Artif. Intell.
- Scale-Space
- Comput. Graph. Forum
- MVA
- IEEE Trans. Robotics Autom.
- Comput. Geom.
- Rendering Techniques
- Int. J. Robotics Res.
- NIPS
- EUROMICRO
- Virtual Real.
- IEEE Trans. Syst. Man Cybern.
- ECCV
- ECCV (2)
- IEEE Trans. Inf. Theory
- ICCHP
- IWMM/GIAE
- ICAC
- J. Comput.
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