ASPECT GRAPH
Experts
- Kevin W. Bowyer
- Jianzhuang Liu
- Jean Ponce
- Ziv Gigus
- François X. Sillion
- Jitendra Malik
- David W. Eggert
- Henrik I. Christensen
- Jean-Yves Ramel
- Yu Cao
- Hiroshi Nagamochi
- P. Y. Mok
- Kok Cheong Wong
- Josef Kittler
- Charles R. Dyer
- Bernard F. Buxton
- David William Murray
- Xiaoou Tang
- Martin C. Cooper
- Attawith Sudsang
- Seok-Hee Hong
- David A. Castelow
- Katsushi Ikeuchi
- Frédo Durand
- Christopher M. Cyr
- Subhash Suri
- Yong Tsui Lee
- Nicole Vincent
- John F. Canny
- Joseph S. B. Mitchell
- P. A. C. Varley
- Aldo Laurentini
- Steve Sullivan
- Maha Sallam
- Kazuo Tanie
- Stéphane Grabli
- Benjamin B. Kimia
- Satoru Morita
- Richard E. Parent
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Int. J. Comput. Vis.
- CoRR
- CVPR
- Comput. Aided Des.
- ICCV
- Pattern Recognit. Lett.
- Pattern Recognit.
- SIGGRAPH
- IROS
- Image Vis. Comput.
- ICPR
- Artif. Intell.
- Vis. Comput.
- Comput. Graph. Forum
- Scale-Space
- BMVC
- Int. J. Pattern Recognit. Artif. Intell.
- ACM Comput. Surv.
- Graph Drawing
- ICME
- SMC
- Int. J. Robotics Res.
- Comput. Geom.
- Rendering Techniques
- MVA
- IEEE Trans. Robotics Autom.
- ICIP
- GREC
- IbPRIA (1)
- IEEE Signal Process. Lett.
- Probl. Inf. Transm.
- AFIPS Fall Joint Computing Conference (1)
- ICMR
- Comput. Vis. Image Underst.
- LREC/COLING
- ICCV Workshops
- PETRA
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