Yoshiki Tsujihashi

Publication Activity (10 Years)

Years Active: 1994-2019
Publications (10 Years): 1

Top Topics

Dynamic Random Access Memory

Container Terminal

Top Venues

Publications

Yoshisato Yokoyama, Kenji Goto, Tomohiro Miura, Yukari Ouchi, Daisuke Nakamura, Jiro Ishikawa, Shunya Nagata, Yoshiki Tsujihashi, Yuichiro Ishii
A Cost Effective Test Screening Circuit for embedded SRAM with Resume Standby on 110-nm SoC/MCU. A-SSCC (2019)
Yoshisato Yokoyama, Yuichiro Ishii, Toshihiro Inada, Koji Tanaka, Miki Tanaka, Yoshiki Tsujihashi, Koji Nii
A cost effective test screening method on 40-nm 4-Mb embedded SRAM for low-power MCU. A-SSCC (2015)
Yoshisato Yokoyama, Yuichiro Ishii, Koji Tanaka, Tatsuya Fukuda, Yoshiki Tsujihashi, Atsushi Miyanishi, Shinobu Asayama, Keiichi Maekawa, Kazutoshi Shiba, Koji Nii
40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of -40 to 170°C with test screening against write disturb issues. A-SSCC (2014)
Yoshisato Yokoyama, Yuichiro Ishii, Hidemitsu Kojima, Atsushi Miyanishi, Yoshiki Tsujihashi, Shinobu Asayama, Kazutoshi Shiba, Koji Tanaka, Tatsuya Fukuda, Koji Nii, Kazumasa Yanagisawa
40nm Ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU. ISQED (2014)
Koji Nii, Hiroshi Makino, Yoshiki Tsujihashi, Chikayoshi Morishima, Yasushi Hayakawa, Hiroyuki Nunogami, Takahiko Arakawa, Hisanori Hamano
A low power SRAM using auto-backgate-controlled MT-CMOS. ISLPED (1998)
Yoshiki Tsujihashi, Hisashi Matsumoto, Hidekatsu Nishimaki, Atsushi Miyanishi, Hiroomi Nakao, Osamu Kitada, Shuhei Iwade, Shinpei Kayano, Masayoshi Sakao
A high-density data-path generator with stretchable cells. IEEE J. Solid State Circuits 29 (1) (1994)