40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of -40 to 170°C with test screening against write disturb issues.
Yoshisato YokoyamaYuichiro IshiiKoji TanakaTatsuya FukudaYoshiki TsujihashiAtsushi MiyanishiShinobu AsayamaKeiichi MaekawaKazutoshi ShibaKoji NiiPublished in: A-SSCC (2014)