40nm Ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU.

Yoshisato Yokoyama Yuichiro Ishii Hidemitsu Kojima Atsushi Miyanishi Yoshiki Tsujihashi Shinobu Asayama Kazutoshi Shiba Koji Tanaka Tatsuya Fukuda Koji Nii Kazumasa Yanagisawa

Published in: ISQED (2014)

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