Xin-chun Wu

Publication Activity (10 Years)

Years Active: 2009-2013
Publications (10 Years): 0

Top Topics

Testing Process

Top Venues

J. Low Power Electron.

Publications

Bin Zhou, Xin-chun Wu, Yu Sun, Tianqi Wang, Liyi Xiao
A Low Power Built-in Self-Test Scheme Based on Overlapping Bit Swapping Linear Feedback Shift Register. J. Low Power Electron. 9 (4) (2013)
Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu, Bei Cao
Test Pattern Generation Based on Multi-TRC Scan Architecture for Reducing Test Cost. J. Low Power Electron. 8 (1) (2012)
Xin-chun Wu, Bin Zhou, Jinxiang Wang, Zhigang Mao
Low Complexity Time Domain Interleaved Partitioning Partial Transmit Sequence Scheme for Peak-to-Average Power Ratio Reduction of Orthogonal Frequency Division Multiplexing Systems. Wirel. Pers. Commun. 60 (2) (2011)
Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu
Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping. J. Electron. Test. 27 (1) (2011)
Xin-chun Wu, Jinxiang Wang, Bin Zhou, Zhigang Mao, Zhiqiang Gao
Companding schemes based on transforming signal statistics into trigonal distributions for PAPR reduction in OFDM systems. Int. J. Commun. Syst. 24 (6) (2011)
Bin Zhou, Yizheng Ye, Zhao-lin Li, Jianwei Zhang, Xin-chun Wu, Rui Ke
A test set embedding approach based on twisted-ring counter with few seeds. Integr. 43 (1) (2010)
Xin-chun Wu, Jinxiang Wang, Zhigang Mao, Jianwei Zhang
Conjugate Interleaved Partitioning PTS Scheme for PAPR Reduction of OFDM Signals. Circuits Syst. Signal Process. 29 (3) (2010)
Bin Zhou, Yizheng Ye, Zhao-lin Li, Xin-chun Wu, Rui Ke
A new low power test pattern generator using a variable-length ring counter. ISQED (2009)
Bin Zhou, Yizheng Ye, Xin-chun Wu, Zhao-lin Li
Reduction of Test Power and Data Volume in BIST Scheme based on Scan Slice Overlapping. ISCAS (2009)