Reduction of Test Power and Data Volume in BIST Scheme based on Scan Slice Overlapping.
Bin ZhouYizheng YeXin-chun WuZhao-lin LiPublished in: ISCAS (2009)
Keyphrases
- data processing
- synthetic data
- data analysis
- high quality
- data collection
- knowledge discovery
- data sets
- data mining techniques
- complex data
- raw data
- test data
- experimental data
- missing data
- data points
- probability distribution
- high dimensional data
- statistical tests
- data quality
- data reduction
- computational power
- multimedia data
- data acquisition
- attribute values
- input data
- image data
- prior knowledge
- social networks