Test Pattern Generation Based on Multi-TRC Scan Architecture for Reducing Test Cost.

Bin Zhou Liyi Xiao Yizheng Ye Xin-chun Wu Bei Cao

Published in: J. Low Power Electron. (2012)

Keyphrases

management system
total cost
high cost
data model
scan data
testing process
distributed architecture
statistical tests
cost sensitive
software architecture
test cases
database
query processing
expert systems
lower bound
database systems
metadata
social networks
genetic algorithm
databases
data sets