Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping.
Bin ZhouLiyi XiaoYizheng YeXin-chun WuPublished in: J. Electron. Test. (2011)
Keyphrases
- data sets
- raw data
- database
- data collection
- high quality
- spatial data
- input data
- data acquisition
- optimization algorithm
- small number
- knowledge discovery
- xml documents
- data analysis
- data structure
- statistical methods
- test data
- data distribution
- original data
- complex data
- computational power
- data processing
- data mining techniques
- dimensionality reduction
- end users
- data sources
- data model
- training data
- decision trees
- databases